Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature

Takahiro Nakayama, Masanori Hashimoto. Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature. IEICE Transactions, 102-A(7):914-917, 2019. [doi]

Authors

Takahiro Nakayama

This author has not been identified. Look up 'Takahiro Nakayama' in Google

Masanori Hashimoto

This author has not been identified. Look up 'Masanori Hashimoto' in Google