Mitsuru Nakazawa, Yoshimitsu Aoki, Masakazu Kobayashi, Hiroyuki Toda. 3D image analysis for evaluating internal deformation/fracture characteristics of materials. In 19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA. pages 1-4, IEEE, 2008. [doi]
Abstract is missing.