Bu-Il Nam, Young-Ha Choi, Sungki Hong, Ki-Young Dong, Wontaeck Jung, Sang-Won Park, Soon-Yong Lee, Dooyeun Jung, Byoung-Hee Kim, Eun-Kyoung Kim, Ki-Whan Song, Jai Hyuk Song, Woo-Young Choi. Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 40-1, IEEE, 2022. [doi]
Abstract is missing.