Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang. A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]
@inproceedings{NamCKKMLJKKSKK08,
title = {A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method},
author = {Junghyun Nam and Sunghoon Chun and Gibum Koo and Yanggi Kim and Byungsoo Moon and Jonghyoung Lim and Jaehoon Joo and Sangseok Kang and Hoonjung Kim and Kyeongseon Shin and Kisang Kang and Sungho Kang},
year = {2008},
doi = {10.1109/TEST.2008.4700632},
url = {http://dx.doi.org/10.1109/TEST.2008.4700632},
researchr = {https://researchr.org/publication/NamCKKMLJKKSKK08},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008},
editor = {Douglas Young and Nur A. Touba},
publisher = {IEEE},
isbn = {978-1-4244-2403-0},
}