Kazuteru Namba, Takashi Katagiri, Hideo Ito. Dual-edge-triggered FF with timing error detection capability. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. pages 187-192, IEEE Computer Society, 2012. [doi]
Abstract is missing.