Tomas Napravnik, Premysl Ziska, Jiri Jakovenko. Novel model calibration method based on differential evolution used for SCR model fitting. In Lukás Sekanina, Görschwin Fey, Jaan Raik, Snorre Aunet, Richard Ruzicka, editors, 16th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2013, Karlovy Vary, Czech Republic, April 8-10, 2013. pages 297-298, IEEE Computer Society, 2013. [doi]
Abstract is missing.