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Parameter Variability in Nanoscale Fabrics: Bottom-Up Integrated Exploration

Pritish Narayanan, Michael Leuchtenburg, Jorge Kina, Prachi Joshi, Pavan Panchapakeshan, Chi On Chui, Csaba Andras Moritz. Parameter Variability in Nanoscale Fabrics: Bottom-Up Integrated Exploration. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 24-31, IEEE Computer Society, 2010. [doi]

Authors

Pritish Narayanan

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Michael Leuchtenburg

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Jorge Kina

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Prachi Joshi

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Pavan Panchapakeshan

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Chi On Chui

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Csaba Andras Moritz

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