Pritish Narayanan, Michael Leuchtenburg, Jorge Kina, Prachi Joshi, Pavan Panchapakeshan, Chi On Chui, Csaba Andras Moritz. Parameter Variability in Nanoscale Fabrics: Bottom-Up Integrated Exploration. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 24-31, IEEE Computer Society, 2010. [doi]
Abstract is missing.