Prakash Narayanan, Satish Ravichandran, Balaji Ramayanam. Novel self-test methods to reduce on-chip memory requirements and improved test coverage. In 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014. pages 198-199, IEEE, 2014. [doi]
Abstract is missing.