Riaz Naseer, Younes Boulghassoul, Jeff Draper, Sandeepan DasGupta, Art Witulski. Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM. In International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA. pages 1879-1882, IEEE, 2007. [doi]
Abstract is missing.