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Hidden-Delay-Fault Sensor for Test, Reliability and Security

Giorgio Di Natale, Elena Ioana Vatajelu, Kalpana Senthamarai Kannan, Lorena Anghel. Hidden-Delay-Fault Sensor for Test, Reliability and Security. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 316-319, IEEE, 2019. [doi]

Authors

Giorgio Di Natale

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Elena Ioana Vatajelu

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Kalpana Senthamarai Kannan

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Lorena Anghel

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