Hidden-Delay-Fault Sensor for Test, Reliability and Security

Giorgio Di Natale, Elena Ioana Vatajelu, Kalpana Senthamarai Kannan, Lorena Anghel. Hidden-Delay-Fault Sensor for Test, Reliability and Security. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 316-319, IEEE, 2019. [doi]

@inproceedings{NataleVKA19,
  title = {Hidden-Delay-Fault Sensor for Test, Reliability and Security},
  author = {Giorgio Di Natale and Elena Ioana Vatajelu and Kalpana Senthamarai Kannan and Lorena Anghel},
  year = {2019},
  doi = {10.23919/DATE.2019.8714891},
  url = {https://doi.org/10.23919/DATE.2019.8714891},
  researchr = {https://researchr.org/publication/NataleVKA19},
  cites = {0},
  citedby = {0},
  pages = {316-319},
  booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019},
  publisher = {IEEE},
  isbn = {978-3-9819263-2-3},
}