Path coverage based functional test generation for processor marginality validation - researchr publication authors

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Suriyaprakash Natarajan, Arun Krishnamachary, Eli Chiprout, Rajesh Galivanche. Path coverage based functional test generation for processor marginality validation. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 544-552, IEEE, 2010. [doi]

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