Carlos Navarro, Maryline Bawedin, François Andrieu, Jacques Cluzel, Xavier Garros, Sorin Cristoloveanu. CMOS VT characterization by capacitance measurements in FDSOI PIN gated diodes. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 405-408, IEEE, 2014. [doi]
Abstract is missing.