The influence of hysteresis voltage on single event transients in a 65nm CMOS high speed comparator - researchr publication authors

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Illani Mohd Nawi, Basel Halak, Mark Zwolinski. The influence of hysteresis voltage on single event transients in a 65nm CMOS high speed comparator. In 21th IEEE European Test Symposium, ETS 2016, Amsterdam, Netherlands, May 23-27, 2016. pages 1-2, IEEE, 2016. [doi]

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