Patrick Ndai, Amit Agarwal, Qikai Chen, Kaushik Roy. A Soft Error Monitor Using Switching Current Detection. In 23rd International Conference on Computer Design (ICCD 2005), 2-5 October 2005, San Jose, CA, USA. pages 185-192, IEEE Computer Society, 2005. [doi]
@inproceedings{NdaiACR05,
title = {A Soft Error Monitor Using Switching Current Detection},
author = {Patrick Ndai and Amit Agarwal and Qikai Chen and Kaushik Roy},
year = {2005},
doi = {10.1109/ICCD.2005.15},
url = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2005.15},
researchr = {https://researchr.org/publication/NdaiACR05},
cites = {0},
citedby = {0},
pages = {185-192},
booktitle = {23rd International Conference on Computer Design (ICCD 2005), 2-5 October 2005, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2451-6},
}