Qikai Chen - researchr alias

researchr

You are not signed in
Sign in
Sign up

Viewing Publication 1 - 17 from 17

2026

Passive Sensing in a Near-Field Multi-ISAC System With Imperfect CSIJian Chen 0008, Qikai Chen, Jie Jia 0001, Baoxin Yin, Xingwei Wang 0001. tccn, 12:4186-4197, 2026. [doi]

2025

Cramér-Rao Bound Minimization for a Passive Sensing Multi-ISAC SystemJian Chen 0008, Qikai Chen, Yansha Deng, Jie Jia 0001, Baoxin Yin, Xingwei Wang 0001. tvt, 74(8):12253-12258, August 2025. [doi]

GCINet: global convolution interaction network with a pre-trained reversible normalization method for long-term time series forecastingJin Fan, Baoshun Yang, Danfeng Sun, Jie Liu, Qikai Chen, Zhipeng Wang, Jia Wu 0001. nca, 37(5):3227-3244, February 2025. [doi]

PDG2Seq: Periodic Dynamic Graph to Sequence Model for Traffic Flow PredictionJin Fan, Wenchao Weng, Qikai Chen, Huifeng Wu, Jia Wu 0001. NN, 183:106941, 2025. [doi]

2023

Multi-scale Fusion Dynamic Graph Neural Network For Traffic Flow PredictionWenchao Weng, Qikai Chen, Yu Dai, Jingyang Chen, Dongliang Chen. admit 2023: 85-90 [doi]

2007

An Accurate Analytical SNM Modeling Technique for SRAMs Based on Butterworth Filter FunctionQikai Chen, Arjun Guha, Kaushik Roy. vlsid 2007: 615-620 [doi]

Memories in Scaled Technologies: A Review of Process Induced Failures, Test Methodologies, and Fault ToleranceSaibal Mukhopadhyay, Qikai Chen, Kaushik Roy. ddecs 2007: 69-74

2006

2005

A novel synthesis approach for active leakage power reduction using dynamic supply gatingSwarup Bhunia, Nilanjan Banerjee, Qikai Chen, Hamid Mahmoodi-Meimand, Kaushik Roy. dac 2005: 479-484 [doi]

Efficient testing of SRAM with optimized march sequences and a novel DFT technique for emerging failures due to process variationsQikai Chen, Hamid Mahmoodi-Meimand, Swarup Bhunia, Kaushik Roy. tvlsi, 13(11):1286-1295, 2005. [doi]

Process Variation Tolerant Online Current Monitor for Robust SystemsQikai Chen, Saibal Mukhopadhyay, Hamid Mahmoodi, Kaushik Roy. iolts 2005: 171-176 [doi]

Modeling and Testing of SRAM for New Failure Mechanisms Due to Process Variations in Nanoscale CMOSQikai Chen, Hamid Mahmoodi-Meimand, Swarup Bhunia, Kaushik Roy. vts 2005: 292-297 [doi]

Energy recovery clocked dynamic logicMatthew Cooke, Hamid Mahmoodi-Meimand, Qikai Chen, Kaushik Roy. glvlsi 2005: 468-471 [doi]

A Soft Error Monitor Using Switching Current DetectionPatrick Ndai, Amit Agarwal, Qikai Chen, Kaushik Roy. iccd 2005: 185-192 [doi]

Sign in or sign up to see more results.

runs on WebDSL