Saibal Mukhopadhyay, Amit Agarwal, Qikai Chen, Kaushik Roy. SRAMs in Scaled Technologies under Process Variations: Failure Mechanisms, Test & Variation Tolerant Design. In Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, DoubleTree Hotel, San Jose, California, USA, September 10-13, 2006. pages 547-554, IEEE, 2006. [doi]
Abstract is missing.