Mohamed Ayoub Neggaz, Ihsen Alouani, Pablo R. Lorenzo, Smaïl Niar. A Reliability Study on CNNs for Critical Embedded Systems. In 36th IEEE International Conference on Computer Design, ICCD 2018, Orlando, FL, USA, October 7-10, 2018. pages 476-479, IEEE, 2018. [doi]
@inproceedings{NeggazALN18,
title = {A Reliability Study on CNNs for Critical Embedded Systems},
author = {Mohamed Ayoub Neggaz and Ihsen Alouani and Pablo R. Lorenzo and Smaïl Niar},
year = {2018},
doi = {10.1109/ICCD.2018.00077},
url = {https://doi.org/10.1109/ICCD.2018.00077},
researchr = {https://researchr.org/publication/NeggazALN18},
cites = {0},
citedby = {0},
pages = {476-479},
booktitle = {36th IEEE International Conference on Computer Design, ICCD 2018, Orlando, FL, USA, October 7-10, 2018},
publisher = {IEEE},
isbn = {978-1-5386-8477-1},
}