Mohamed Ayoub Neggaz, Ihsen Alouani, Pablo R. Lorenzo, Smaïl Niar. A Reliability Study on CNNs for Critical Embedded Systems. In 36th IEEE International Conference on Computer Design, ICCD 2018, Orlando, FL, USA, October 7-10, 2018. pages 476-479, IEEE, 2018. [doi]
Abstract is missing.