Investigation of proton irradiated dual field plate AlGaN/GaN HEMTs: TCAD based assessment

Neha, Vandana Kumari, Mridula Gupta, Manoj Saxena. Investigation of proton irradiated dual field plate AlGaN/GaN HEMTs: TCAD based assessment. Microelectronics Journal, 122:105405, 2022. [doi]

Abstract

Abstract is missing.