Development of a device characterization curve tracer based on transient thermal measurement - researchr publication authors

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E. Talebi Nejad, F. A. Mohammadi, E. Astvatsatryan. Development of a device characterization curve tracer based on transient thermal measurement. In Proceedings of the 24th Canadian Conference on Electrical and Computer Engineering, CCECE 2011, Niagara Falls, Ontario, Canada, 8-11 May, 2011. pages 1198-1201, IEEE, 2011. [doi]

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