E. Talebi Nejad, F. A. Mohammadi, E. Astvatsatryan. Development of a device characterization curve tracer based on transient thermal measurement. In Proceedings of the 24th Canadian Conference on Electrical and Computer Engineering, CCECE 2011, Niagara Falls, Ontario, Canada, 8-11 May, 2011. pages 1198-1201, IEEE, 2011. [doi]
Abstract is missing.