E. Talebi Nejad, F. A. Mohammadi, E. Astvatsatryan. Development of a device characterization curve tracer based on transient thermal measurement. In Proceedings of the 24th Canadian Conference on Electrical and Computer Engineering, CCECE 2011, Niagara Falls, Ontario, Canada, 8-11 May, 2011. pages 1198-1201, IEEE, 2011. [doi]
@inproceedings{NejadMA11, title = {Development of a device characterization curve tracer based on transient thermal measurement}, author = {E. Talebi Nejad and F. A. Mohammadi and E. Astvatsatryan}, year = {2011}, doi = {10.1109/CCECE.2011.6030652}, url = {http://doi.ieeecomputersociety.org/10.1109/CCECE.2011.6030652}, researchr = {https://researchr.org/publication/NejadMA11}, cites = {0}, citedby = {0}, pages = {1198-1201}, booktitle = {Proceedings of the 24th Canadian Conference on Electrical and Computer Engineering, CCECE 2011, Niagara Falls, Ontario, Canada, 8-11 May, 2011}, publisher = {IEEE}, isbn = {978-1-4244-9788-1}, }