Test and repair of large embedded DRAMs. 2

Eric A. Nelson, Jeffrey Dreibelbis, Roderick McConnell. Test and repair of large embedded DRAMs. 2. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 173-181, IEEE Computer Society, 2001.

Authors

Eric A. Nelson

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Jeffrey Dreibelbis

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Roderick McConnell

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