Eric A. Nelson, Jeffrey Dreibelbis, Roderick McConnell. Test and repair of large embedded DRAMs. 2. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 173-181, IEEE Computer Society, 2001.
@inproceedings{NelsonDM01,
title = {Test and repair of large embedded DRAMs. 2},
author = {Eric A. Nelson and Jeffrey Dreibelbis and Roderick McConnell},
year = {2001},
tags = {testing},
researchr = {https://researchr.org/publication/NelsonDM01},
cites = {0},
citedby = {0},
pages = {173-181},
booktitle = {Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001},
publisher = {IEEE Computer Society},
isbn = {0-7803-7169-0},
}