Efficient Deterministic Test Generation for BIST Schemes with LFSR Reseeding

Stelios Neophytou, Maria K. Michael, Spyros Tragoudas. Efficient Deterministic Test Generation for BIST Schemes with LFSR Reseeding. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy. pages 43-50, IEEE Computer Society, 2006. [doi]

Abstract

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