Built-in Self-Repair in a 3D die stack using programmable logic

Kundan Nepal, Xi Shen, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar. Built-in Self-Repair in a 3D die stack using programmable logic. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 243-248, IEEE, 2013. [doi]

@inproceedings{NepalSDMB13,
  title = {Built-in Self-Repair in a 3D die stack using programmable logic},
  author = {Kundan Nepal and Xi Shen and Jennifer Dworak and Theodore W. Manikas and R. Iris Bahar},
  year = {2013},
  doi = {10.1109/DFT.2013.6653613},
  url = {http://dx.doi.org/10.1109/DFT.2013.6653613},
  researchr = {https://researchr.org/publication/NepalSDMB13},
  cites = {0},
  citedby = {0},
  pages = {243-248},
  booktitle = {2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013},
  publisher = {IEEE},
}