Sowmith Nethula, Vivek Bansal, Ghaith Bany Hamad, Otmane Aït Mohamed. Layout-based Vulnerability Analysis of LEON3 Processor to Single Event Multiple Transients using Satisfiability Modulo Theories. In 23rd International Symposium on Quality Electronic Design, ISQED 2022, Santa Clara, CA, USA, April 6-7, 2022. pages 1-6, IEEE, 2022. [doi]
@inproceedings{NethulaBHM22,
title = {Layout-based Vulnerability Analysis of LEON3 Processor to Single Event Multiple Transients using Satisfiability Modulo Theories},
author = {Sowmith Nethula and Vivek Bansal and Ghaith Bany Hamad and Otmane Aït Mohamed},
year = {2022},
doi = {10.1109/ISQED54688.2022.9806199},
url = {https://doi.org/10.1109/ISQED54688.2022.9806199},
researchr = {https://researchr.org/publication/NethulaBHM22},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {23rd International Symposium on Quality Electronic Design, ISQED 2022, Santa Clara, CA, USA, April 6-7, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9466-3},
}