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Layout-based Vulnerability Analysis of LEON3 Processor to Single Event Multiple Transients using Satisfiability Modulo Theories

Sowmith Nethula, Vivek Bansal, Ghaith Bany Hamad, Otmane Aït Mohamed. Layout-based Vulnerability Analysis of LEON3 Processor to Single Event Multiple Transients using Satisfiability Modulo Theories. In 23rd International Symposium on Quality Electronic Design, ISQED 2022, Santa Clara, CA, USA, April 6-7, 2022. pages 1-6, IEEE, 2022. [doi]

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