Florian Neugebauer, Ilia Polian, John P. Hayes. Framework for quantifying and managing accuracy in stochastic circuit design. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.