Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian. A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]
@inproceedings{NeyBDGPVB08,
title = {A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs},
author = {Alexandre Ney and Alberto Bosio and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian},
year = {2008},
doi = {10.1109/TEST.2008.4700555},
url = {http://dx.doi.org/10.1109/TEST.2008.4700555},
researchr = {https://researchr.org/publication/NeyBDGPVB08},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008},
editor = {Douglas Young and Nur A. Touba},
publisher = {IEEE},
isbn = {978-1-4244-2403-0},
}