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Jin-Aun Ng, Nobuyuki Sugii, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Takeo Hattori, Hiroshi Iwai. 3 nMISFETs after post deposition annealing. IEICE Electronic Express, 3(13):316-321, 2006. [doi]
Abstract is missing.