Henry Y. T. Ngan, Grantham K. H. Pang, Nelson Hon Ching Yung. Patterned Fabric Defect Detection using a Motif-Based Approach. In Proceedings of the International Conference on Image Processing, ICIP 2007, September 16-19, 2007, San Antonio, Texas, USA. pages 33-36, IEEE, 2007. [doi]
@inproceedings{NganPY07,
title = {Patterned Fabric Defect Detection using a Motif-Based Approach},
author = {Henry Y. T. Ngan and Grantham K. H. Pang and Nelson Hon Ching Yung},
year = {2007},
doi = {10.1109/ICIP.2007.4379085},
url = {http://dx.doi.org/10.1109/ICIP.2007.4379085},
tags = {rule-based, systematic-approach},
researchr = {https://researchr.org/publication/NganPY07},
cites = {0},
citedby = {0},
pages = {33-36},
booktitle = {Proceedings of the International Conference on Image Processing, ICIP 2007, September 16-19, 2007, San Antonio, Texas, USA},
publisher = {IEEE},
}