Henry Y. T. Ngan, Grantham K. H. Pang, Nelson Hon Ching Yung. Patterned Fabric Defect Detection using a Motif-Based Approach. In Proceedings of the International Conference on Image Processing, ICIP 2007, September 16-19, 2007, San Antonio, Texas, USA. pages 33-36, IEEE, 2007. [doi]
No references recorded for this publication.
No citations of this publication recorded.