The following publications are possibly variants of this publication:
- Motif-based defect detection for patterned fabricHenry Y. T. Ngan, Grantham K. H. Pang, Nelson Hon Ching Yung. PR, 41(6):1878-1894, 2008. [doi]
- Ellipsoidal decision regions for motif-based patterned fabric defect detectionHenry Y. T. Ngan, Grantham K. H. Pang, Nelson H. C. Yung. PR, 43(6):2132-2144, 2010. [doi]
- Wavelet based methods on patterned fabric defect detectionHenry Y. T. Ngan, Grantham K. H. Pang, S. P. Yung, Michael Kwok-Po Ng. PR, 38(4):559-576, 2005. [doi]
- Defect Detection on Patterned Jacquard FabricHenry Y. T. Ngan, Grantham K. H. Pang, S. P. Yung, Michael K. Ng. aipr 2003: 163-168 [doi]