Yves Ngu, Ephrem G. Gebreselasie, Rajendran Krishnasamy, Rick Rassel. Ballast Resistor Temperature Effect and Ruggedness. In 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), Nashville, TN, USA, November 3-6, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{NguGKR19,
title = {Ballast Resistor Temperature Effect and Ruggedness},
author = {Yves Ngu and Ephrem G. Gebreselasie and Rajendran Krishnasamy and Rick Rassel},
year = {2019},
doi = {10.1109/BCICTS45179.2019.8972747},
url = {https://doi.org/10.1109/BCICTS45179.2019.8972747},
researchr = {https://researchr.org/publication/NguGKR19},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), Nashville, TN, USA, November 3-6, 2019},
publisher = {IEEE},
isbn = {978-1-7281-0586-4},
}