Yves Ngu, Ephrem G. Gebreselasie, Rajendran Krishnasamy, Rick Rassel. Ballast Resistor Temperature Effect and Ruggedness. In 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS), Nashville, TN, USA, November 3-6, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.