Nguyen P. Nguyen, Ilker Ersoy, Tommi White, Filiz Bunyak. Automated Particle Picking in Cryo-Electron Micrographs using Deep Regression. In Huiru Jane Zheng, Zoraida Callejas, David Griol, Haiying Wang, Xiaohua Hu, Harald Schmidt, Jan Baumbach, Julie Dickerson, Le Zhang, editors, IEEE International Conference on Bioinformatics and Biomedicine, BIBM 2018, Madrid, Spain, December 3-6, 2018. pages 2453-2460, IEEE, 2018. [doi]
@inproceedings{NguyenEWB18,
title = {Automated Particle Picking in Cryo-Electron Micrographs using Deep Regression},
author = {Nguyen P. Nguyen and Ilker Ersoy and Tommi White and Filiz Bunyak},
year = {2018},
doi = {10.1109/BIBM.2018.8621224},
url = {https://doi.org/10.1109/BIBM.2018.8621224},
researchr = {https://researchr.org/publication/NguyenEWB18},
cites = {0},
citedby = {0},
pages = {2453-2460},
booktitle = {IEEE International Conference on Bioinformatics and Biomedicine, BIBM 2018, Madrid, Spain, December 3-6, 2018},
editor = {Huiru Jane Zheng and Zoraida Callejas and David Griol and Haiying Wang and Xiaohua Hu and Harald Schmidt and Jan Baumbach and Julie Dickerson and Le Zhang},
publisher = {IEEE},
isbn = {978-1-5386-5488-0},
}