Tuyen V. Nguyen, Peter Feldmann, Stephen W. Director, Ronald A. Rohrer. SPECS simulation validation with efficient transient sensitivity computation. In 1989 IEEE International Conference on Computer-Aided Design, ICCAD 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers. pages 252-255, IEEE, 1989. [doi]
Abstract is missing.