Maximum Likelihood Approach for RFID Tag Cardinality Estimation under Capture Effect and Detection Errors

Chuyen T. Nguyen, Kazunori Hayashi, Megumi Kaneko, Hideaki Sakai. Maximum Likelihood Approach for RFID Tag Cardinality Estimation under Capture Effect and Detection Errors. IEICE Transactions, 96-B(5):1122-1129, 2013. [doi]

Authors

Chuyen T. Nguyen

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Kazunori Hayashi

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Megumi Kaneko

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Hideaki Sakai

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