Chuyen T. Nguyen, Kazunori Hayashi, Megumi Kaneko, Hideaki Sakai. Maximum Likelihood Approach for RFID Tag Cardinality Estimation under Capture Effect and Detection Errors. IEICE Transactions, 96-B(5):1122-1129, 2013. [doi]
@article{NguyenHKS13, title = {Maximum Likelihood Approach for RFID Tag Cardinality Estimation under Capture Effect and Detection Errors}, author = {Chuyen T. Nguyen and Kazunori Hayashi and Megumi Kaneko and Hideaki Sakai}, year = {2013}, url = {http://search.ieice.org/bin/summary.php?id=e96-b_5_1122}, researchr = {https://researchr.org/publication/NguyenHKS13}, cites = {0}, citedby = {0}, journal = {IEICE Transactions}, volume = {96-B}, number = {5}, pages = {1122-1129}, }