Maximum Likelihood Approach for RFID Tag Cardinality Estimation under Capture Effect and Detection Errors

Chuyen T. Nguyen, Kazunori Hayashi, Megumi Kaneko, Hideaki Sakai. Maximum Likelihood Approach for RFID Tag Cardinality Estimation under Capture Effect and Detection Errors. IEICE Transactions, 96-B(5):1122-1129, 2013. [doi]

Possibly Related Publications

The following publications are possibly variants of this publication: