Thai-Hoang Nguyen, Muhammad Imran 0010, Jaehyuk Choi 0001, Joon-Sung Yang. CRAFT: Criticality-Aware Fault-Tolerance Enhancement Techniques for Emerging Memories-Based Deep Neural Networks. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(10):3289-3300, October 2023. [doi]
Abstract is missing.