Hung Viet Nguyen, Youngmin Kim. 32 nm FinFET-based 0.7-to-1.1 V digital voltage sensor with 50 mV resolution. In IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012. pages 1-4, IEEE, 2012. [doi]
Abstract is missing.