Deep Metric Learning Meets Deep Clustering: An Novel Unsupervised Approach for Feature Embedding - researchr publication authors

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Binh X. Nguyen, Binh D. Nguyen, Gustavo Carneiro, Erman Tjiputra, Quang D. Tran, Thanh-Toan Do. Deep Metric Learning Meets Deep Clustering: An Novel Unsupervised Approach for Feature Embedding. In 31st British Machine Vision Conference 2020, BMVC 2020, Virtual Event, UK, September 7-10, 2020. BMVA Press, 2020. [doi]

This author has not been identified. Look up 'Binh X. Nguyen' in GoogleThis author has not been identified. Look up 'Binh D. Nguyen' in GoogleThis author has not been identified. Look up 'Gustavo Carneiro' in GoogleThis author has not been identified. Look up 'Erman Tjiputra' in GoogleThis author has not been identified. Look up 'Quang D. Tran' in GoogleThis author has not been identified. Look up 'Thanh-Toan Do' in Google

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