Binh X. Nguyen, Binh D. Nguyen, Gustavo Carneiro, Erman Tjiputra, Quang D. Tran, Thanh-Toan Do. Deep Metric Learning Meets Deep Clustering: An Novel Unsupervised Approach for Feature Embedding. In 31st British Machine Vision Conference 2020, BMVC 2020, Virtual Event, UK, September 7-10, 2020. BMVA Press, 2020. [doi]
@inproceedings{NguyenNCTTD20,
title = {Deep Metric Learning Meets Deep Clustering: An Novel Unsupervised Approach for Feature Embedding},
author = {Binh X. Nguyen and Binh D. Nguyen and Gustavo Carneiro and Erman Tjiputra and Quang D. Tran and Thanh-Toan Do},
year = {2020},
url = {https://www.bmvc2020-conference.com/assets/papers/0328.pdf},
researchr = {https://researchr.org/publication/NguyenNCTTD20},
cites = {0},
citedby = {0},
booktitle = {31st British Machine Vision Conference 2020, BMVC 2020, Virtual Event, UK, September 7-10, 2020},
publisher = {BMVA Press},
}