Binh X. Nguyen, Binh D. Nguyen, Gustavo Carneiro, Erman Tjiputra, Quang D. Tran, Thanh-Toan Do. Deep Metric Learning Meets Deep Clustering: An Novel Unsupervised Approach for Feature Embedding. In 31st British Machine Vision Conference 2020, BMVC 2020, Virtual Event, UK, September 7-10, 2020. BMVA Press, 2020. [doi]
Abstract is missing.