Phuc Nguyen, Khai Nguyen, Ryutaro Ichise, Hideaki Takeda 0001. EmbNum: Semantic Labeling for Numerical Values with Deep Metric Learning. In Ryutaro Ichise, Freddy Lécué, Takahiro Kawamura, Dongyan Zhao, Stephen Muggleton, Kouji Kozaki, editors, Semantic Technology - 8th Joint International Conference, JIST 2018, Awaji, Japan, November 26-28, 2018, Proceedings. Volume 11341 of Lecture Notes in Computer Science, pages 119-135, Springer, 2018. [doi]
Abstract is missing.