Thi Hai Binh Nguyen, Van Huan Nguyen, Hakil Kim. Robust Feature Extraction for Facial Image Quality Assessment. In Yongwha Chung, Moti Yung, editors, Information Security Applications - 11th International Workshop, WISA 2010, Jeju Island, Korea, August 24-26, 2010, Revised Selected Papers. Volume 6513 of Lecture Notes in Computer Science, pages 292-306, Springer, 2010. [doi]